The X-REF C12 is a desktop energy dispersive X-ray fluorescence spectrometer. X-REF C12 provides multielement analysis of samples from carbon (С) to uranium (U), with concentration on the level of several ppm and up to dozens of percents. X-REF C12 developed for analysis of various nature and industrial materials.

Use of X-ray tube and SDD with ultrathin windows allow register and analyze well separated and intense lines of Carbon, Nitrogen, Oxygen, Fluorine and Sodium in samples with complex composition.

Особенности

The X-REF C12 is a desktop energy dispersive X-ray fluorescence spectrometer. X-REF C12 provides multielement analysis of samples from carbon (С) to uranium (U), with concentration on the level of several ppm and up to dozens of percents. X-REF C12 developed for analysis of various nature and industrial materials.Superb analytical characteristics are provided by the application of direct excitation geometry and Silicon Drift Detector (SDD) with thin window. This combination guarantee good analytical parameters: excellent definition of elements, low detection limits, high accuracy and safety.Measurements could be done in air or in vacuum, depending on element number in periodic table. Capability to make measurements with helium is also provided.